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University of Washington Engineering Library
(englib@u.washington.edu); (206)543-0740
1. Bandyopadhyay, Sanghamitra, 1968-
CLASSIFICATION AND LEARNING USING GENETIC ALGORITHMS : APPLICATIONS IN
BIOINFORMATICS AND WEB INTELLIGENCE / SANGHAMITRA BANDYOPADHYAY, SANKAR K. PAL.
Berlin ; New York : Springer, c2007.
Q327 .B36 2007.
2. Everett, Gerald D., 1943-
SOFTWARE TESTING : TESTING ACROSS THE ENTIRE SOFTWARE DEVELOPMENT LIFE CYCLE /
GERALD D. EVERETT, RAYMOND MCLEOD, JR.
[Piscataway, NJ] : IEEE Press ; Hoboken, N.J. : Wiley-Interscience, c2007.
QA76.76.T48 E94 2007.
3. DATA MINING WITH ONTOLOGIES : IMPLEMENTATIONS, FINDINGS, AND FRAMEWORKS /
HECTOR OSCAR NIGRO, SANDRA ELIZABETH GONZALEZ CISARO, DANIEL HUGO
XODO [EDITORS].
Hershey, PA : Information Science Reference, c2008.
QA76.9.D343 D39 2008.
4. Symposium on Structural Integrity of Fasteners (3rd : 2004 : Washington, D.C.).
STRUCTURAL INTEGRITY OF FASTENERS INCLUDING THE EFFECTS OF ENVIRONMENT AND
STRESS CORROSION CRACKING : 3RD VOLUME / PIR M. TOOR AND JOSEPH BARRON, EDITORS.
West Conshohocken, PA : ASTM, c2007.
TA401 .A657 no.1487.
5. Christopoulos, Christos.
PRINCIPLES AND TECHNIQUES OF ELECTROMAGNETIC COMPATIBILITY / CHRISTOS
CHRISTOPOULOS.
Boca Raton : CRC Press, c2007.
TK7867.5 .C47 2007.
6. CMOS BIOTECHNOLOGY / HAKHO LEE, DONHEE HAM, ROBERT M. WESTERVELT (EDITORS).
New York : Springer, c2007.
TK7871.99.M44 C565 2007.
7. Sachdev, Manoj.
DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS / BY MANOJ SACHDEV
AND JOS{226}E PINEDA DE GYVEZ.
Dordrecht : Springer, c2007.
TK7871.99.M44 S23 2007.
8. Verma, Manish.
ADVANCED MEMORY OPTIMIZATION TECHNIQUES FOR LOW POWER EMBEDDED PROCESSORS / BY
MANISH VERMA AND PETER MARWEDEL.
Dordrecht : Springer, c2007.
TK7895.M4 V47 2007.
9. Hermans, Carolien.
BROADBAND OPTO-ELECTRICAL RECEIVERS IN STANDARD CMOS / BY CAROLIEN HERMANS AND
MICHIEL STEYAERT.
Dordrecht : Springer Verlag, 2007.
TK8312 .H476 2007.
10. PHYSICS-BASED ANIMATION / KENNY ERLEBEN ... [ET AL.].
Hingham, Mass. : Charles River Media, c2005.
TR897.7 .P525 2005.
